1. Spar 2010 has an agenda that offers something for everyone.
2. Mobile and Scan to BIM appear to be the top tracks.
3. Add the exhibits and the networking and the ROI is going to be hard to beat.

Today is the last day to register for SPAR 2010 at the current price. After today there will be a $100 increase. Also worth noting is the fact that the third person attending from the same company gets a 50% discount. Finally there is a mentoring program for interns and new hires – within 6 [...]

Spar 2010 is going to be held in the The Woodlands (Houston), TX February 8 – 10, 2010.
Last year’s highly successful “bootcamps” will be expanded this year.
With the early signs of recovery starting to appear, the timing of this event could not be better for kicking off a successful 2010.

1. Michael Baker Jr., Inc. has purchased a Lynx Mobile Mapper from Optech.
2. This is a vote of confidence in the technology and Optech.
3. It may not be such good news for the service providers.

1. Optech will be hosting their first Innovative LiDAR Solutions Conference June 24 – 26.
2. Optech is well positioned to be a key player in the rapidly developing mobile market.
3. The OGC’s 3D Fusion Summit and CityGML standard are building an important foundation.

1. The Canadian Consortium for LiDAR Environmental Applications Research, C-Clear is working with ASPRS to advance the industry through knowledge transfer programs.
2. Research conducted by C-Clear in 2004 identified a significant need in the end user community for training programs.
3. End user training courses are now available through Nova Scotia Community College Center for Geographic Sciences – COGS.

1. Thanks to an In the Scan reader today’s blog is all about Interface – a laser scanning consortium.
2. Unavco is funded by NSF and NASA. They manage the Interface consortium.
3. This is a model for other parts of the US and perhaps other countries.

1. Many of the key players were present at the ASPRS special mobile lidar mapping session.
2. The georeferencing component is the limiting factor in achieving the desired accuracy.
3. Additional data attributes are being collected in order to support more automated feature extraction.